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Mos Interface Physics, Process And Characterization

Shengkai Wang & Xiaolei Wang

Mos Interface Physics, Process And Characterization
Mos Interface Physics, Process And Characterization

Mos Interface Physics, Process And Characterization

Shengkai Wang & Xiaolei Wang

Hardback / bound | English
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Description

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

Specifications

  • Publisher
    Taylor & Francis Ltd
  • Pub date
    Oct 2021
  • Pages
    162
  • Theme
    Electrical engineering
  • Dimensions
    157 x 235 x 17 mm
  • Weight
    390 gram
  • EAN
    9781032106274
  • Hardback / bound
    Hardback / bound
  • Language
    English

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