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New Technologies in Electromagnetic Non-destructive Testing

Songling Huang & Shen Wang

New Technologies in Electromagnetic Non-destructive Testing
New Technologies in Electromagnetic Non-destructive Testing

New Technologies in Electromagnetic Non-destructive Testing

Songling Huang & Shen Wang

Hardback / bound | English
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Description

The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing.

Specifications

  • Publisher
    Springer Verlag, Singapore
  • Pub date
    Mar 2016
  • Theme
    Electronics: circuits and components
  • Dimensions
    235 x 155 mm
  • EAN
    9789811005770
  • Hardback / bound
    Hardback / bound
  • Language
    English