• No shipping costs from € 15, -
  • Lists and tips from our own specialists
  • Possibility of ordering without an account
  • No shipping costs from € 15, -
  • Lists and tips from our own specialists
  • Possibility of ordering without an account

Reliability and Failure Analysis of High-Power LED Packaging

Cher Ming Tan & Preetpal Singh

Reliability and Failure Analysis of High-Power LED Packaging
Reliability and Failure Analysis of High-Power LED Packaging

Reliability and Failure Analysis of High-Power LED Packaging

Cher Ming Tan & Preetpal Singh

Paperback | English
  • Available, delivery time is 10-15 working days
  • Not in stock in our shop
€204.50
  • From €15,- no shipping costs.
  • 30 days to change your mind and return physical products

Description

Professor Cher Ming Tan obtained his PhD in Electrical Engineering from the University of Toronto in 1992. He has eight years of working experience in reliability in the electronics industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as a faculty member in 1996 where he stayed until 2014. He is now a Professor at Chang Gung University, Taiwan, and the Director of the Centre of Reliability Science and Technology (CReST). He has published more than 400 international journal and conference papers and holds 14 patents and 1 copyright for reliability software. He has given more than 100 keynote and invited talks at international conferences. He has written 6 books and 4 book chapters in the field of reliability. He is the Series Editor of Springer Briefs in Reliability, Editor of Scientific Reports, Editor of IEEE Transactions on Materials and Device Reliability, Associate Editor of Microelectronics Reliability, and Research Editor of Frontiers in Materials. He is Fellow of the Institute of Engineers, Singapore, Fellow of the Singapore Quality Institute, and an IEEE Electron Devices Distinguished Lecturer. He is also on the technical committee for reviewing IEEE Reliability Standards 1413.1 and 1624. Dr. Preetpal Singh received his BS from the Guru Nanak Engineering College, Hyderabad, India, in 2007, and MS from Amity University, Noida, India, in 2013. He completed his PhD in 2018 with the Department of Electronic Engineering and Center for Reliability Sciences and Technologies (CReST), Chang Gung University in Taoyuan, Taiwan. His research interests include graphene-based high-power LEDs, high-power LED degradation study, and LED reliability. He has published his research in reputed journals like the IEEE-TDMR, Microelectronics Reliability, and Scientific Reports. He holds a US patent for his work on High Power LEDs substrate—GaN thermal and lattice mismatch improvement. He is also the Reviewer for the IEEE-TDMR and microelectronics journals. Presently he is working with Epistar, Taiwan, as Senior Research Engineer and is responsible for development of different types of LEDs.

Professor Cher Ming Tan obtained his PhD in Electrical Engineering from the University of Toronto in 1992. He has eight years of working experience in reliability in the electronics industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as a faculty member in 1996 where he stayed until 2014. He is now a Professor at Chang Gung University, Taiwan, and the Director of the Centre of Reliability Science and Technology (CReST). He has published more than 400 international journal and conference papers and holds 14 patents and 1 copyright for reliability software. He has given more than 100 keynote and invited talks at international conferences. He has written 6 books and 4 book chapters in the field of reliability. He is the Series Editor of Springer Briefs in Reliability, Editor of Scientific Reports, Editor of IEEE Transactions on Materials and Device Reliability, Associate Editor of Microelectronics Reliability, and Research Editor of Frontiers in Materials. He is Fellow of the Institute of Engineers, Singapore, Fellow of the Singapore Quality Institute, and an IEEE Electron Devices Distinguished Lecturer. He is also on the technical committee for reviewing IEEE Reliability Standards 1413.1 and 1624. Dr. Preetpal Singh received his BS from the Guru Nanak Engineering College, Hyderabad, India, in 2007, and MS from Amity University, Noida, India, in 2013. He completed his PhD in 2018 with the Department of Electronic Engineering and Center for Reliability Sciences and Technologies (CReST), Chang Gung University in Taoyuan, Taiwan. His research interests include graphene-based high-power LEDs, high-power LED degradation study, and LED reliability. He has published his research in reputed journals like the IEEE-TDMR, Microelectronics Reliability, and Scientific Reports. He holds a US patent for his work on High Power LEDs substrate—GaN thermal and lattice mismatch improvement. He is also the Reviewer for the IEEE-TDMR and microelectronics journals. Presently he is working with Epistar, Taiwan, as Senior Research Engineer and is responsible for development of different types of LEDs.

Specifications

  • Publisher
    Woodhead Publishing
  • Pub date
    Sep 2022
  • Pages
    188
  • Theme
    Materials science
  • Dimensions
    229 x 152 mm
  • Weight
    1000 gram
  • EAN
    9780128224083
  • Paperback
    Paperback
  • Language
    English