Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory
Rui Lan
Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory
Rui Lan
Hardback / bound
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English
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Description
This book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them.
Ms. Rui Lan received the B.S. degree from Department of Material Science and Technology, Dalian University of Technology, Dalian, China in 2005, the M.S. and Ph.D. degrees from Department of Metallurgy and Ceramics Sciences, Tokyo Institute of Technology (TITECH), Japan in 2009 and 2012, respectively. Since 2013, she has been an Associate Professor at Department of Material Science and Technology, Jiangsu University of Science and Technology, Zhenjiang, China. Her research interests include Phase change storage materials, thermoelectric thin film materials, high-entropy alloy coating and semiconductor materials.