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Resultaten voor 'm patel'
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Solar based Car Charging and Parking System
€ 52,95 -
Biofuel Production, Performance, and Emission Optimization
A Comprehensive Approach to Modelling and OptimizationThis book explores the urgent quest for sustainable energy solutions by examining potential renewable energy sources that meet global demands.
€ 131,95 -
Hydrogen from Seawater Splitting
Technology and outlookHydrogen has an important role to play in decarbonised energy systems, but it is vital to generate it without carbon emissions, for example, using sunlight and abundant sea water. This work covers techniques for generating hydrogen from seawater, their advantages and shortcomings.
€ 152,50 -
Reducción del tiempo de prueba durante el diseño para la comprobabilidad
Dado que la tecnología VLSI se está reduciendo continuamente a nodos tecnológicos más bajos, necesitamos una técnica eficiente para las pruebas. Actualmente, la fiabilidad y la capacidad de prueba son parámetros importantes en el diseño VLSI actual. Reducir el tiempo de prueba es el mayor desafío en la DFT (o prueba) basada en el escaneo, la secuencia que, cuando se aplica a un circuito digital, permitirá a los equipos de prueba automática distinguir entre el comportamiento correcto del circuito y el comportamiento defectuoso del circuito causado por los defectos. Ahora bien, los equipos ATE son máquinas muy caras, es decir, (i) un mayor número de patrones de prueba tardará más tiempo en ejecutarse y eso se traduce en un mayor coste. (ii) más arquitectura de datos para una prueba rentable. Por lo tanto, un mayor volumen de patrones requerirá una mayor capacidad de almacenamiento. Un mayor volumen de patrones también requiere más tiempo para la operación de escaneo en el DUT. El compilador DFT de Synopsys se utiliza para generar el diseño de escaneo verificado. La herramienta ATPG genera vectores que pueden detectar el volumen que necesita más memoria para ser almacenado, lo que supondrá un mayor coste. La herramienta ATPG genera un informe estadístico posterior que nos indica la información de la categoría de fallo que tenemos que interpretar para depurar los problemas de cobertura. La mejora del tiempo de prueba mediante la reordenación de las celdas de escaneo es el objetivo principal.
€ 43,90 -
Riduzione del tempo di prova durante la progettazione per la testabilità
Poiché la tecnologia VLSI si sta continuamente riducendo a nodi tecnologici più bassi, abbiamo bisogno di una tecnica efficiente per i test. Ora, l'affidabilità e la testabilità sono entrambi parametri importanti nella progettazione VLSI di oggi. Ridurre il tempo di test è la sfida principale in scan based DFT (o test) la sequenza che, quando applicata a un circuito digitale, permetterà alle apparecchiature di test automatico di distinguere tra il comportamento corretto del circuito e quello difettoso causato dai difetti. Ora, le macchine ATE sono macchine molto costose, cioè (i) un numero maggiore di modelli di test richiederà più tempo per essere eseguito e questo si traduce in un costo maggiore. (ii) più architettura di dati per un test efficace dal punto di vista dei costi. Quindi, più volume di pattern richiederà più capacità di archiviazione. Un volume di pattern più grande richiede anche più tempo per l'operazione di scansione nel DUT. Il compilatore DFT di Synopsys viene utilizzato per generare il progetto di scansione verificato. Lo strumento ATPG genera vettori che possono rilevare il volume necessario per memorizzare più memoria, il che comporterà un costo maggiore. Lo strumento ATPG genera un rapporto statistico in seguito che ci dice informazioni sulla categoria di errore che dobbiamo interpretare per debuggare i problemi di copertura. Il miglioramento del tempo di test riordinando le celle di scansione è l'obiettivo principale.
€ 43,90 -
Réduction du temps de test pendant la conception pour la testabilité
Comme la technologie VLSI se réduit continuellement à des nœuds technologiques inférieurs, nous avons besoin de techniques de test efficaces. Aujourd'hui, la fiabilité et la testabilité sont deux paramètres importants dans la conception VLSI. La réduction du temps de test est un défi majeur pour le DFT (ou test) basé sur le balayage, la séquence qui, lorsqu'elle est appliquée à un circuit numérique, permet à l'équipement de test automatique de distinguer le comportement correct du circuit du comportement défectueux du circuit causé par des défauts. Aujourd'hui, les machines ATE sont des machines très coûteuses, c'est-à-dire que (i) plus le nombre de motifs de test est élevé, plus le temps d'exécution est long, ce qui entraîne une augmentation des coûts. (ii) plus d'architecture de données pour un test rentable. Ainsi, un plus grand volume de motifs nécessitera une plus grande capacité de stockage. Un volume de motifs plus important nécessite également plus de temps pour l'opération de balayage dans l'objet sous test. Le compilateur DFT de Synopsys est utilisé pour générer le modèle de balayage vérifié. L'outil ATPG génère des vecteurs qui peuvent détecter le volume nécessitant plus de mémoire pour le stocker, ce qui entraînera un coût plus élevé. L'outil ATPG génère ensuite un rapport statistique qui nous donne des informations sur les catégories de défauts que nous devons interpréter pour déboguer les problèmes de couverture. L'amélioration du temps de test en réorganisant les cellules de balayage est le principal objectif.
€ 43,90 -
Reduzierung der Testzeit während des Designs für Testbarkeit
Da die VLSI-Technologie ständig auf kleinere Technologieknoten schrumpft, benötigen wir eine effiziente Testtechnik. Zuverlässigkeit und Testbarkeit sind die wichtigsten Parameter beim heutigen VLSI-Design. Die Verkürzung der Testzeit ist eine große Herausforderung bei der scanbasierten DFT (oder dem Test), da die Sequenz, wenn sie auf eine digitale Schaltung angewendet wird, es automatischen Testgeräten ermöglicht, zwischen dem korrekten Schaltungsverhalten und dem fehlerhaften Schaltungsverhalten zu unterscheiden, das durch Defekte verursacht wird. ATE-Maschinen sind sehr teuer, d.h. (i) eine größere Anzahl von Testmustern erfordert mehr Zeit für die Ausführung, was zu höheren Kosten führt. (ii) mehr Datenarchitektur für kosteneffektive Tests. Ein größeres Mustervolumen erfordert also mehr Speicherkapazität. Ein größeres Mustervolumen erfordert auch mehr Zeit für den Scanvorgang im DUT. Der DFT-Compiler von Synopsys wird zur Erstellung des verifizierten Scan-Designs verwendet. Das ATPG-Tool generiert Vektoren, die das Volumen erkennen können, das mehr Speicherplatz benötigt, was wiederum zu höheren Kosten führt. Das ATPG-Tool generiert später einen Statistikbericht, der uns Informationen zur Fehlerkategorie liefert, die wir interpretieren müssen, um Abdeckungsprobleme zu beheben. Hauptaugenmerk liegt auf der Verbesserung der Testzeit durch die Neuanordnung der Scan-Zellen.
€ 43,90 -
Sokraschenie wremeni testirowaniq pri proektirowanii dlq obespecheniq testiruemosti
Poskol'ku tehnologiq SBIS postoqnno sokraschaetsq do bolee nizkih tehnologicheskih uzlow, nam neobhodimy äffektiwnye metody testirowaniq. V nastoqschee wremq nadezhnost' i testiruemost' qwlqütsq wazhnymi parametrami pri proektirowanii sowremennyh SBIS. Sokraschenie wremeni testirowaniq qwlqetsq osnownoj zadachej w DFT na osnowe skanirowaniq (ili testirowaniq) posledowatel'nosti, kotoraq, buduchi primenennoj k cifrowoj sheme, pozwolit awtomaticheskomu testowomu oborudowaniü otlichit' prawil'noe powedenie shemy ot neprawil'nogo, wyzwannogo defektami. V nastoqschee wremq, ATE mashiny qwlqütsq ochen' dorogimi mashinami, t.e. (i) bol'shee kolichestwo testowyh shablonow trebuet bol'she wremeni dlq wypolneniq, chto priwodit k uwelicheniü stoimosti. (ii) bol'she dannyh arhitektury dlq äkonomicheski äffektiwnogo ispytaniq. Takim obrazom, bol'shij ob#em shablonow trebuet bol'shej emkosti hranilischa. Bol'shij ob#em shablonow takzhe trebuet bol'she wremeni na operaciü skanirowaniq w IU. DFT Compiler ot Synopsys ispol'zuetsq dlq generacii werificirowannogo dizajna skanirowaniq. Instrument ATPG generiruet wektory, kotorye mogut opredelit' ob#em, trebuüschij bol'she pamqti dlq hraneniq, chto priwedet k uwelicheniü zatrat. Vposledstwii instrument ATPG generiruet statisticheskij otchet, kotoryj soobschaet nam informaciü o kategorii neisprawnosti, kotoruü my dolzhny interpretirowat' dlq otladki problem pokrytiq. Osnownoe wnimanie udelqetsq uluchsheniü wremeni testirowaniq putem izmeneniq porqdka qcheek skanirowaniq.
€ 19,80 -
Shipboard Propulsion, Power Electronics, and Ocean Energy
"I think the approach is sound in the development of the materials and the sequence in which they are covered by the book. … the book ties many diverse areas of electrical power system design and operation together nicely. … the material presented is covered in sufficient depth for use by students to better comprehend the unique requirements that go into the design and operation of variable frequency drives in both shipboard power system usage as well as other real world applications. ... an excellent addition to the curriculum for professional mariners. … instrumental to the proper operation of commercial and military seagoing vessels."—Anthony J. Indelicato, U.S. Department of Energy (2006-Present), U.S. Naval Officer (Submarine Qualified) (1995-2006) "I have taught this course and see a good fit for this book. … Its collection of diverse topics are generally not taught together. This book can be surely be used for multiple courses with some sections used in one class. … very well written, descriptive with examples covering different application domains. … This book not only fills the gap in application of power electronics in shipboard propulsion and ocean energy, but also does it in best possible way. It provides detailed examples in multiple related application domains. Writing a book covering such a diverse domain is tough, but the author has done a great job of relating those together and putting it nicely. This book provides balance between being highly technical and easily understandable." —Anurag K Srivastava, Washington State University, Pullman, USA
€ 304,95 -
Innovations in Electronics and Communication Engineering
Proceedings of the 6th ICIECE 2017The book is a collection of best selected research papers presented at 6th International Conference on Innovations in Electronics and Communication Engineering at Guru Nanak Institutions Hyderabad, India.
€ 186,95 -
Shipboard Propulsion, Power Electronics, and Ocean Energy
"I think the approach is sound in the development of the materials and the sequence in which they are covered by the book. … the book ties many diverse areas of electrical power system design and operation together nicely. … the material presented is covered in sufficient depth for use by students to better comprehend the unique requirements that go into the design and operation of variable frequency drives in both shipboard power system usage as well as other real world applications. ... an excellent addition to the curriculum for professional mariners. … instrumental to the proper operation of commercial and military seagoing vessels."—Anthony J. Indelicato, U.S. Department of Energy (2006-Present), U.S. Naval Officer (Submarine Qualified) (1995-2006) "I have taught this course and see a good fit for this book. … Its collection of diverse topics are generally not taught together. This book can be surely be used for multiple courses with some sections used in one class. … very well written, descriptive with examples covering different application domains. … This book not only fills the gap in application of power electronics in shipboard propulsion and ocean energy, but also does it in best possible way. It provides detailed examples in multiple related application domains. Writing a book covering such a diverse domain is tough, but the author has done a great job of relating those together and putting it nicely. This book provides balance between being highly technical and easily understandable." —Anurag K Srivastava, Washington State University, Pullman, USA
€ 120,50 -
Photothermal Science and Techniques
This book provides a comprehensive framework for workers in materials science, physics, chemistry, metrology and non-destructive testing, entering the field of photothermal and thermal wave techniques and can be used by those making use of these methods for a wide range of applications. The essential physics is covered from basic principles, using thermal wave analysis to gain physical insight. Each of the commonly used measurement systems is described and assessed, and the major application areas: spectroscopy; non-destructive evaluation; thermal properties measurement and semiconductor material evaluation are each reviewed.
€ 139,09